X-ray diffraction topography of lattice defects in MgAl2O4 and ScAlMgO4 crystals grown under different technological conditions - Digital Repository of Scientific Institutes

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$X-ray diffraction topography of lattice defects in MgAl2O4 and ScAlMgO4 crystals grown under different technological conditions$

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Title: X-ray diffraction topography of lattice defects in MgAl2O4 and ScAlMgO4 crystals grown under different technological conditions

Creator:

Wierzbicka Edyta

Date issued/created:

Resource type:

Subtitle:

Electronic Materials T 43 Nr 1 2015

Contributor:

Malinowska Agnieszka ; Wierzchowski Wojciech ; Kisielewski Jarosław ; Świrkowicz Marek ; Szyrski Włodzimierz ; Romaniec Magdalena ; Mazur Krystyna

Publisher:

Place of publishing:

Description:

Bibliogr. p.: 38-39 ; p. 29-39 il., 30 cm.

References:

38-39

Relation:

Electronic Materials T. 43 Nr 1 2015

Volume:

Issue:

Start page:

End page:

Detailed Resource Type:

Format:

30 cm ; application/pdf

Resource Identifier:

oai:rcin.org.pl:56845

Source:

click here to follow the link

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Rights:

Rights Reserved - Free Access

Terms of use:

Copyright-protected material. May be used within the limits of statutory user freedoms

Digitizing institution:

Institute of Electronic Materials Technology

Original in:

Library of the Electronic Materials Technology Institute

Projects co-financed by:

Programme Innovative Economy, 2010-2014, Priority Axis 2. R&D infrastructure ; European Union. European Regional Development Fund

Access:

Subject and keywords:

X-ray diffraction topography MgAl2O4 ScAlMgO4 crystal lattice defects Czochralski method

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Last modified:

Oct 2, 2020

In our library since:

Nov 3, 2015

Number of object content downloads / hits:

1475

All available object's versions:

https://www.rcin.org.pl/publication/77415

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MATERIAŁY ELEKTRONICZNE

Edition name	Date
Wierzbicka Edyta, Rentgenowska topografia dyfrakcyjna defektów sieci krystalicznej w monokryształach MgAl2O4 i ScAlMgO4 otrzymywanych w różnych warunkach technologicznych	Oct 2, 2020

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