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<dc:title xml:lang="en"><![CDATA[Materiały Elektroniczne 2010 T.38 nr 3/4]]></dc:title>
<dc:title xml:lang="en"><![CDATA[Deep-level deffects in epitaxial 4H-SiC irradiated with low-energy electrons = Głębokie centra defektowe w warstwach epitaksjalnych 4H-SiC napromieniowanych elektronami o niskiej energii]]></dc:title>
<dc:title xml:lang="pl"><![CDATA[Materiały Elektroniczne 2010 T.38 nr 3/4]]></dc:title>
<dc:title xml:lang="pl"><![CDATA[Deep-level deffects in epitaxial 4H-SiC irradiated with low-energy electrons]]></dc:title>
<dc:creator><![CDATA[Kamiński Paweł]]></dc:creator>
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<dc:subject xml:lang="en"><![CDATA[DLTS]]></dc:subject>
<dc:subject xml:lang="en"><![CDATA[4H-SiC]]></dc:subject>
<dc:subject xml:lang="en"><![CDATA[electron traps]]></dc:subject>
<dc:subject xml:lang="en"><![CDATA[points defects]]></dc:subject>
<dc:subject xml:lang="pl"><![CDATA[Materiały elektroniczne]]></dc:subject>
<dc:subject xml:lang="pl"><![CDATA[Elektronika - czasopismo - materiały]]></dc:subject>
<dc:subject xml:lang="pl"><![CDATA[4H-SiC]]></dc:subject>
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<dc:description xml:lang="en"><![CDATA[Bibliogr. s. 33-34]]></dc:description>
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<dc:description xml:lang="pl"><![CDATA[Bibliogr. s. 33-34]]></dc:description>
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<dc:date><![CDATA[2010]]></dc:date>
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<dc:relation><![CDATA[Materiały Elektroniczne]]></dc:relation>
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