@misc{Sikorski_Krzysztof_Metody_1987,
 author={Sikorski Krzysztof},
 volume={58},
 number={2},
 editor={Szummer Andrzej},
 copyright={Rights Reserved - Free Access},
 address={Warszawa},
 journal={Electronic Materials},
 howpublished={online},
 year={1987},
 publisher={Wydaw. Przemysłu Maszynowego "WEMA"},
 language={pol},
 title={Metody ilościowej mikroanalizy rent5geowskiej cienkich warstw na podłożach = Correction methods in quantitative electron probe X-ray microanalysis of thin coatings},
 type={Text},
 URL={http://www.rcin.org.pl/Content/9629/PDF/WA901_12512_M1_r1987-z2-58_Mater-Elektroniczne_Sikorski_i.pdf},
 keywords={Electronic - journal - material, Electronic materials, electron probe X-ray microanalysis, thin layer technology, thin layer},
}