@misc{Wierzbicka_Edyta_X-ray_2015,
 author={Wierzbicka Edyta},
 volume={43},
 editor={Malinowska Agnieszka},
 editor={Wierzchowski Wojciech},
 editor={Kisielewski Jarosław},
 editor={Świrkowicz Marek},
 editor={Szyrski Włodzimierz},
 editor={Romaniec Magdalena},
 editor={Mazur Krystyna},
 number={1},
 copyright={Rights Reserved - Free Access},
 address={Warszawa},
 journal={Electronic Materials T. 43 Nr 1 2015},
 howpublished={online},
 year={2015},
 publisher={ITME},
 language={pol},
 type={Text},
 title={X-ray diffraction topography of lattice defects in MgAl2O4 and ScAlMgO4 crystals grown under different technological conditions},
 URL={http://www.rcin.org.pl/Content/56845/PDF/Wierzbicka.pdf},
 keywords={X-ray diffraction topography, MgAl2O4, ScAlMgO4, crystal lattice defects, Czochralski method},
}